Gazing at Crystal Balls – Electron Backscatter Diffraction Indexing and Cross Correlation on a Sphere
نویسندگان
چکیده
منابع مشابه
Cross-correlation for Automated Stitching of Two-dimensional Multi-tile Electron Backscatter Diffraction Data (preprint)
A method for automatically aligning consecutive datasets of large, two-dimensional multi-tile electron backscatter diffraction (EBSD) scans with high accuracy was developed. The method involves first locating grain and phase boundaries within search regions containing overlapping data in adjacent scan tiles, and subsequently using cross-correlation algorithms to determine the relative position ...
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Imaging magnetic domains for soft magnetic materials using scanning electron microscopy (SEM) typically requires a specially modified setup. These modifications can include higher beam acceleration voltages, modifications of the sample and detector geometry, and/or specialized detectors to detect the spin polarization of secondary electrons [1,2]. In this research, a method is presented for ima...
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Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
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Electron backscatter diffraction (EBSD) originated in materials science and has transferred to biomineral research providing insight into fossil and modern biominerals. An electron microscopy technique, EBSD requires a fine polished sample surface where the electron beam diffracts in the first few lattice layers, identifying mineral, polymorph and crystallographic orientation. The technique is ...
متن کاملDirect detection of electron backscatter diffraction patterns.
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2019
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192761901050x